Description:

Students will gain knowledge about circuit testing and about methods for increasing reliability and security. They will get practical skills to be able to prepare a test set with the help of the intuitive path sensitization and to use an ATPG for automatic test generation. They will be able to design easily testable circuits and systems with built-in-self-test equipment. They will be able to compute, analyze, and control the reliability and availability of the designed circuits.

Contents:

1. Introduction, terminology, defects, faults
2. Test generation for combinational circuits
3. Automatic Test Patterns Generation algorithms (ATPG)
4. Sequential circuits testing, fault simulation
5. Dependability, increasing dependability
6. Dependability models, dependability computation
7. Design for testability
8. Sequential circuit testing - scan design
9. Interconnect testing, SoC and NoC testing
10. Built-in self-test (BIST)
11. Test compression
12. Memory and FPGA testing

Seminar contents:

1. Introduction to the course
2. Faults in digital circuits
3. Tests generation for combinational circuits, D-Algorithm
4. ATPG Atalanta, Boolean Differential calculus
5. SAT-based ATPG
6. Testing of sequential circuits
7. Reliability Block Diagrams
8. Markov reliability models
9. Fault Tree Analysis and other reliability models
10. Reliability standards
11. Assessment test, BIST design
12. Assessment

Recommended literature:

1. Novák, O. - Gramatová, E. - Ubar, R. : Handbook of Testing Electronic Systems. ČVUT, 2005. ISBN 80-01-03318-X.
2. Velazco, R. - McMorrow, D. - Estela, J. : Radiation Effects on Integrated Circuits and Systems for Space Applications. Springer, 2019. ISBN 978-3-030-04660-6.
3. Navabi, Z. : Digital System Test and Testable Design. Springer, 2011. ISBN 978-1-4419-7547-8.
4. da Silva, F. - McLaurin, T. - Waayers, T. : The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500. Springer, 2006. ISBN 978-0-387-34609-0.

Keywords:

Digital circuits testing, DFT, reliability analysis, design of reliable and fail-safe systems.

Abbreviations used:

Semester:

• W ... winter semester (usually October - February)
• S ... spring semester (usually March - June)
• W,S ... both semesters

Mode of completion of the course:

• A ... Assessment (no grade is given to this course but credits are awarded. You will receive only P (Passed) of F (Failed) and number of credits)
• GA ... Graded Assessment (a grade is awarded for this course)
• EX ... Examination (a grade is awarded for this course)
• A, EX ... Examination (the award of Assessment is a precondition for taking the Examination in the given subject, a grade is awarded for this course)

Weekly load (hours per week):

• P ... lecture
• C ... seminar
• L ... laboratory
• R ... proseminar
• S ... seminar